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    Intensity analysis of polarized Raman spectra for off axis single crystal silicon

    New search for: Ramabadran, Uma
    New search for: Roughani, Bahram

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    Intensity analysis of polarized Raman spectra for off axis single crystal silicon

    New search for: Ramabadran, Uma
    New search for: Roughani, Bahram

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Intensity analysis of polarized Raman spectra for off axis single crystal silicon

    New search for: Ramabadran, Uma
    New search for: Roughani, Bahram

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Intensity analysis of polarized Raman spectra for off axis single crystal silicon

    Contributors:

    Ramabadran, Uma (author) / Roughani, Bahram (author)

    Published in:

    Materials science & engineering B ; 230 ; 31-42

    Publication date:

    2018-01-01

    Size:

    12 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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