Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Study of Indentation Damage in Single Crystal Silicon Carbide by Using Micro Raman Spectroscopy

    New search for: Yamaguchi, M.
    New search for: Fujitsuka, M.
    New search for: Ueno, S.
    New search for: Miura, I.
    New search for: Erikawa, W.
    New search for: Tomita, T.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Study of Indentation Damage in Single Crystal Silicon Carbide by Using Micro Raman Spectroscopy

    New search for: Yamaguchi, M.
    New search for: Fujitsuka, M.
    New search for: Ueno, S.
    New search for: Miura, I.
    New search for: Erikawa, W.
    New search for: Tomita, T.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Study of Indentation Damage in Single Crystal Silicon Carbide by Using Micro Raman Spectroscopy

    New search for: Yamaguchi, M.
    New search for: Fujitsuka, M.
    New search for: Ueno, S.
    New search for: Miura, I.
    New search for: Erikawa, W.
    New search for: Tomita, T.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Study of Indentation Damage in Single Crystal Silicon Carbide by Using Micro Raman Spectroscopy

    Contributors:

    Yamaguchi, M. (author) / Fujitsuka, M. (author) / Ueno, S. (author) / Miura, I. (author) / Erikawa, W. (author) / Tomita, T. (author) / Bauer, A.J. / Friedrichs, P. / Krieger, M. / Pensl, G.

    Published in:

    Silicon Carbide and Related Materials 2009 ; 551-554

    MATERIALS SCIENCE FORUM ; 645/648

    Publication date:

    2010-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Characterization of Silicon Carbide using Raman Spectroscopy

    Burton, J. C. / Long, F. H. / Khlebnikov, Y. et al. | British Library Online Contents | 2000

    Effect of thermal oxidation on indentation and scratching of single-crystal silicon carbide on microscale

    Pohlmann, K. / Bhushan, B. / Zum Gahr, K. H. | British Library Online Contents | 2000

    Strain determination around Vickers indentation on silicon surface by Raman spectroscopy

    Puech, P. / Demangeot, F. / Pizani, P. S. | British Library Online Contents | 2004

    Investigations of the Indentation-Induced Crystallographic Phase Changes in Silicon Using Raman Spectroscopy

    Chaudhri, M. M. / Khayyat, M. M. O. / Hasko, D. G. | British Library Online Contents | 2007

    Effect of soft substrate on the indentation damage in silicon carbide deposited on graphite

    Lee, K. S. / Park, J. Y. / Kim, W.-J. et al. | British Library Online Contents | 2000

    Back to top