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    Ultrahigh hardness and high electrical resistivity in nano-twinned, nanocrystalline high-entropy alloy films

    New search for: Huo, Wenyi
    New search for: Liu, Xiaodong
    New search for: Tan, Shuyong
    New search for: Fang, Feng
    New search for: Xie, Zonghan
    New search for: Shang, Jianku
    New search for: Jiang, Jianqing

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    Ultrahigh hardness and high electrical resistivity in nano-twinned, nanocrystalline high-entropy alloy films

    New search for: Huo, Wenyi
    New search for: Liu, Xiaodong
    New search for: Tan, Shuyong
    New search for: Fang, Feng
    New search for: Xie, Zonghan
    New search for: Shang, Jianku
    New search for: Jiang, Jianqing

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ultrahigh hardness and high electrical resistivity in nano-twinned, nanocrystalline high-entropy alloy films

    New search for: Huo, Wenyi
    New search for: Liu, Xiaodong
    New search for: Tan, Shuyong
    New search for: Fang, Feng
    New search for: Xie, Zonghan
    New search for: Shang, Jianku
    New search for: Jiang, Jianqing

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Ultrahigh hardness and high electrical resistivity in nano-twinned, nanocrystalline high-entropy alloy films

    Contributors:

    Huo, Wenyi (author) / Liu, Xiaodong (author) / Tan, Shuyong (author) / Fang, Feng (author) / Xie, Zonghan (author) / Shang, Jianku (author) / Jiang, Jianqing (author)

    Published in:

    Applied surface science ; 439 ; 222-225

    Publication date:

    2018-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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