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    Microstructure, hardness, resistivity and thermal stability of sputtered oxide films of AlCoCrCu0.5NiFe high-entropy alloy

    New search for: Huang, Y. S.
    New search for: Chen, L.
    New search for: Lui, H. W.
    New search for: Cai, M. H.
    New search for: Yeh, J. W.

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    Microstructure, hardness, resistivity and thermal stability of sputtered oxide films of AlCoCrCu0.5NiFe high-entropy alloy

    New search for: Huang, Y. S.
    New search for: Chen, L.
    New search for: Lui, H. W.
    New search for: Cai, M. H.
    New search for: Yeh, J. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructure, hardness, resistivity and thermal stability of sputtered oxide films of AlCoCrCu0.5NiFe high-entropy alloy

    New search for: Huang, Y. S.
    New search for: Chen, L.
    New search for: Lui, H. W.
    New search for: Cai, M. H.
    New search for: Yeh, J. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Microstructure, hardness, resistivity and thermal stability of sputtered oxide films of AlCoCrCu0.5NiFe high-entropy alloy

    Contributors:

    Huang, Y. S. (author) / Chen, L. (author) / Lui, H. W. (author) / Cai, M. H. (author) / Yeh, J. W. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A ; 457 ; 77-83

    Publication date:

    2007-01-01

    Size:

    7 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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