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    Measurement on critical shear stress of circular point contact utilizing Atomic Force Microscope

    New search for: Yan, Xinyang
    New search for: Peng, Jinfeng
    New search for: Liu, Sisi
    New search for: Wang, Yinmin
    New search for: Zheng, Xuejun

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    Measurement on critical shear stress of circular point contact utilizing Atomic Force Microscope

    New search for: Yan, Xinyang
    New search for: Peng, Jinfeng
    New search for: Liu, Sisi
    New search for: Wang, Yinmin
    New search for: Zheng, Xuejun

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Measurement on critical shear stress of circular point contact utilizing Atomic Force Microscope

    New search for: Yan, Xinyang
    New search for: Peng, Jinfeng
    New search for: Liu, Sisi
    New search for: Wang, Yinmin
    New search for: Zheng, Xuejun

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Measurement on critical shear stress of circular point contact utilizing Atomic Force Microscope

    Contributors:

    Yan, Xinyang (author) / Peng, Jinfeng (author) / Liu, Sisi (author) / Wang, Yinmin (author) / Zheng, Xuejun (author)

    Published in:

    MATERIALS LETTERS ; 220 ; 293-296

    Publication date:

    2018-01-01

    Size:

    4 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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