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Substrate temperature dependent structural orientation of EBPVD deposited NiO films and its influence on optical, electrical property
Substrate temperature dependent structural orientation of EBPVD deposited NiO films and its influence on optical, electrical property
Substrate temperature dependent structural orientation of EBPVD deposited NiO films and its influence on optical, electrical property
Kuanr, Sushil Kumar (author) / Vinothkumar, G. (author) / Babu, K. Suresh (author)
Materials science in semiconductor processing ; 75 ; 26-30
2018-01-01
5 pages
Article (Journal)
English
DDC:
621.38152
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