Anneal induced transformations of defects in hadron irradiated Si wafers and Schottky diodes: Fid-Bau Portal

Anneal induced transformations of defects in hadron irradiated Si wafers and Schottky diodes

Gaubas, E. / Ceponis, T. / Deveikis, L. / Meskauskaite, D. / Pavlov, J. / Rumbauskas, V. / Vaitkus, J. / Moll, M. / Ravotti, F.

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Anneal induced transformations of defects in hadron irradiated Si wafers and Schottky diodes

Gaubas, E. / Ceponis, T. / Deveikis, L. / Meskauskaite, D. / Pavlov, J. / Rumbauskas, V. / Vaitkus, J. / Moll, M. / Ravotti, F.

Anneal induced transformations of defects in hadron irradiated Si wafers and Schottky diodes

Gaubas, E. / Ceponis, T. / Deveikis, L. / Meskauskaite, D. / Pavlov, J. / Rumbauskas, V. / Vaitkus, J. / Moll, M. / Ravotti, F.

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Title:

Anneal induced transformations of defects in hadron irradiated Si wafers and Schottky diodes

Contributors:

Gaubas, E. (author) / Ceponis, T. (author) / Deveikis, L. (author) / Meskauskaite, D. (author) / Pavlov, J. (author) / Rumbauskas, V. (author) / Vaitkus, J. (author) / Moll, M. (author) / Ravotti, F. (author)

Published in:

Materials science in semiconductor processing ; 75 ; 157-165

Publication date:

2018-01-01

Size:

9 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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