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    Photoelectron spectroscopy as an in situ contact-less method for studies of MOS properties of ultrathin oxides on Si

    New search for: Silva, Ana G.
    New search for: Pedersen, Kjeld
    New search for: Li, Zheshen S.
    New search for: Morgen, Per

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    Photoelectron spectroscopy as an in situ contact-less method for studies of MOS properties of ultrathin oxides on Si

    New search for: Silva, Ana G.
    New search for: Pedersen, Kjeld
    New search for: Li, Zheshen S.
    New search for: Morgen, Per

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Photoelectron spectroscopy as an in situ contact-less method for studies of MOS properties of ultrathin oxides on Si

    New search for: Silva, Ana G.
    New search for: Pedersen, Kjeld
    New search for: Li, Zheshen S.
    New search for: Morgen, Per

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Photoelectron spectroscopy as an in situ contact-less method for studies of MOS properties of ultrathin oxides on Si

    Contributors:

    Silva, Ana G. (author) / Pedersen, Kjeld (author) / Li, Zheshen S. (author) / Morgen, Per (author)

    Published in:

    Applied surface science ; 353 ; 1208-1213

    Publication date:

    2015-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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