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    Molecular dynamics study of the effect of point defects on the stress at the Si/Ge interface

    New search for: Chen, Xian
    New search for: Zhang, Jing
    New search for: Han, Liang
    New search for: Tang, Zhaohuan

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    Molecular dynamics study of the effect of point defects on the stress at the Si/Ge interface

    New search for: Chen, Xian
    New search for: Zhang, Jing
    New search for: Han, Liang
    New search for: Tang, Zhaohuan

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Molecular dynamics study of the effect of point defects on the stress at the Si/Ge interface

    New search for: Chen, Xian
    New search for: Zhang, Jing
    New search for: Han, Liang
    New search for: Tang, Zhaohuan

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Molecular dynamics study of the effect of point defects on the stress at the Si/Ge interface

    Contributors:

    Chen, Xian (author) / Zhang, Jing (author) / Han, Liang (author) / Tang, Zhaohuan (author)

    Published in:

    Applied surface science ; 456 ; 43-48

    Publication date:

    2018-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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