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Determination of N-polar AlN/GaN heterojunction valance-band offsets by X-ray photoelectron spectroscopy
Determination of N-polar AlN/GaN heterojunction valance-band offsets by X-ray photoelectron spectroscopy
Determination of N-polar AlN/GaN heterojunction valance-band offsets by X-ray photoelectron spectroscopy
Du, Jin-Juan (author) / Xu, Sheng-Rui (author) / Zhang, Jin-Cheng (author) / Li, Pei-Xian (author) / Lin, Zhi-Yu (author) / Zhao, Ying (author) / Peng, Ruo-Shi (author) / Fan, Xiao-Meng (author) / Tao, Hong-Chang (author) / Hao, Yue (author)
MATERIALS LETTERS ; 230 ; 135-138
2018-01-01
4 pages
Article (Journal)
Unknown
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