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    Large scale atomic force microscopy for characterisation of optical surfaces and coatings

    New search for: Sturwald, S.
    New search for: Schmitt, R.

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    Large scale atomic force microscopy for characterisation of optical surfaces and coatings

    New search for: Sturwald, S.
    New search for: Schmitt, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Large scale atomic force microscopy for characterisation of optical surfaces and coatings

    New search for: Sturwald, S.
    New search for: Schmitt, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Large scale atomic force microscopy for characterisation of optical surfaces and coatings

    Contributors:

    Sturwald, S. (author) / Schmitt, R. (author)

    Published in:

    International journal of precision technology ; 2 ; 136-152

    Publication date:

    2011-01-01

    Size:

    17 pages

    ISSN:

    1755-2060

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  670.5

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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