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Electronic and atomic structure studies of tin oxide layers using X-ray absorption near edge structure spectroscopy data modelling

Manyakin, M.D. / Kurganskii, S.I. / Dubrovskii, O.I. / Chuvenkova, O.A. / Domashevskaya, E.P. / Ryabtsev, S.V. / Ovsyannikov, R. / Parinova, E.V. / Sivakov, V. / Turishchev, S. Yu.

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Electronic and atomic structure studies of tin oxide layers using X-ray absorption near edge structure spectroscopy data modelling

Manyakin, M.D. / Kurganskii, S.I. / Dubrovskii, O.I. / Chuvenkova, O.A. / Domashevskaya, E.P. / Ryabtsev, S.V. / Ovsyannikov, R. / Parinova, E.V. / Sivakov, V. / Turishchev, S. Yu.

Electronic and atomic structure studies of tin oxide layers using X-ray absorption near edge structure spectroscopy data modelling

Manyakin, M.D. / Kurganskii, S.I. / Dubrovskii, O.I. / Chuvenkova, O.A. / Domashevskaya, E.P. / Ryabtsev, S.V. / Ovsyannikov, R. / Parinova, E.V. / Sivakov, V. / Turishchev, S. Yu.

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Title:

Electronic and atomic structure studies of tin oxide layers using X-ray absorption near edge structure spectroscopy data modelling

Contributors:

Manyakin, M.D. (author) / Kurganskii, S.I. (author) / Dubrovskii, O.I. (author) / Chuvenkova, O.A. (author) / Domashevskaya, E.P. (author) / Ryabtsev, S.V. (author) / Ovsyannikov, R. (author) / Parinova, E.V. (author) / Sivakov, V. (author) / Turishchev, S. Yu. (author)

Published in:

Materials science in semiconductor processing ; 99 ; 28-33

Publication date:

2019-01-01

Size:

6 pages

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Classification:

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

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