A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Advances in Scanning Probe Microscopy
This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices
Advances in Scanning Probe Microscopy
This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices
Advances in Scanning Probe Microscopy
Sakurai, Toshio (author) / Watanabe, Yousuke
2000
Online-Ressource (XIV, 343 p)
digital
Campusweiter Zugriff (Universität Hannover). - Vervielfältigungen (z.B. Kopien, Downloads) sind nur von einzelnen Kapiteln oder Seiten und nur zum eigenen wissenschaftlichen Gebrauch erlaubt. Keine Weitergabe an Dritte. Kein systematisches Downloaden durch Robots.
Book
Electronic Resource
English
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