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Theory of Scanning Probe Microscopy
Summary The first-principles simulation method of STM images is introduced and applied to various surface systems. It is clarified how atomic resolution can be achieved by STM, and tip effects are discussed. For the case of scanning force microscopy, we have been able to reproduce FFM images of graphite fairly well by use of a simple tip model involving only a single atom. Cantilever dynamics for dynamic-mode AFM are carefully studied using numerical simulations and analysis of the equation of motion. The mechanisms of dynamic force microscopy are discussed in the light of these results.
Theory of Scanning Probe Microscopy
Summary The first-principles simulation method of STM images is introduced and applied to various surface systems. It is clarified how atomic resolution can be achieved by STM, and tip effects are discussed. For the case of scanning force microscopy, we have been able to reproduce FFM images of graphite fairly well by use of a simple tip model involving only a single atom. Cantilever dynamics for dynamic-mode AFM are carefully studied using numerical simulations and analysis of the equation of motion. The mechanisms of dynamic force microscopy are discussed in the light of these results.
Theory of Scanning Probe Microscopy
Sasaki, Naruo (author) / Tsukada, Masaru (author)
2000-01-01
41 pages
Article/Chapter (Book)
Electronic Resource
English
Scan Probe Microscopy , Resonance Curve , Hard Wall , Scan Force Microscopy , Hard Wall Model Engineering , Electronics and Microelectronics, Instrumentation , Science, general , Materials Science, general , Surfaces and Interfaces, Thin Films , Optical and Electronic Materials , Solid State Physics
British Library Online Contents | 2006
Advances in Scanning Probe Microscopy
| TIBKAT | 2000
Introduction to Scanning Probe Microscopy
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Scanning Probe Microscopy : Analytical Methods
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Focus on scanning probe microscopy
British Library Online Contents | 2003