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Electron transmission microscopy of rolled structure of various Cu purities
2 high purity (99.999% and 99.98%) specimens were rolled up to 30 μ thickness and these foils were prepared for electron transmission examination; dislocations and twinning are compared.
Electron transmission microscopy of rolled structure of various Cu purities
2 high purity (99.999% and 99.98%) specimens were rolled up to 30 μ thickness and these foils were prepared for electron transmission examination; dislocations and twinning are compared.
Electron transmission microscopy of rolled structure of various Cu purities
Observation par microscopie electronique en transmission des structures de laminage de cuivres de puretes differentes
Bourelier, F. (author) / Montuelle, J. (author)
1963
4 pages
Article (Journal)
French
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