A platform for research: civil engineering, architecture and urbanism
Simulation of homogenization behavior of compacted bentonite containing technological voids using modified penalty-based contact model
Simulation of homogenization behavior of compacted bentonite containing technological voids using modified penalty-based contact model
Simulation of homogenization behavior of compacted bentonite containing technological voids using modified penalty-based contact model
Computers and Geotechnics
Deng, Rong-Sheng (author) / Chen, Bao (author) / Ye, Wei-Min (author) / Chen, Yong-Gui (author) / Wang, Qiong (author)
Computers and Geotechnics ; 177 ; 106894
2025-01-01
Article (Journal)
Electronic Resource
English