Quantitative X-Ray Diffraction Analysis of Chromium(III) Doped Tricalcium Silicate Pastes: Fid-Bau Portal

Quantitative X-Ray Diffraction Analysis of Chromium(III) Doped Tricalcium Silicate Pastes

Omotoso, O.E.

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Quantitative X-Ray Diffraction Analysis of Chromium(III) Doped Tricalcium Silicate Pastes

Omotoso, O.E.

Quantitative X-Ray Diffraction Analysis of Chromium(III) Doped Tricalcium Silicate Pastes

Omotoso, O.E.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Quantitative X-Ray Diffraction Analysis of Chromium(III) Doped Tricalcium Silicate Pastes

Contributors:

Omotoso, O.E. (author) / Ivey, D.G. / Mikula, R.

Published in:

Cement and concrete research ; 26

Publication date:

1996

ISSN:

0008-8846

Type of media:

Article (Journal)

Type of material:

Language:

English

Keywords:

Zement , Zeitschrift , Beton

Classification:

Local classification TIB: 770/6530
BKL: 58.45 / 56.45 Baustoffkunde / 58.45 Gesteinshüttenkunde / 56.45

Omotoso, O. E. / Ivey, D. G. / Mikula, R. | British Library Online Contents | 1996

Quantitative X-ray diffraction analysis of chromium(III) doped tricalcium silicate pastes

Omotoso, O.E. / Ivey, D.G. / Mikula, R. | Tema Archive | 1996

A trimethylsilylation study of tricalcium silicate pastes

Mohan, K. / Taylor, H.F.W. | Elsevier | 1981

Pastes of tricalcium silicate with rice husk ash

Khan, M.H. / Mohan, K. / Taylor, H.F.W. | Elsevier | 1984

Hexavalent chromium in tricalcium silicate. Part I: Quantitative X-ray diffraction analysis of crystalline hydration products

Omotoso, O.E. / Ivey, D.G. / Mikula, R. | Tema Archive | 1998