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Temperature Sensitivity Characterization of a Silicon Diode Array Spectrometer

Starks, Patrick J.

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Temperature Sensitivity Characterization of a Silicon Diode Array Spectrometer

Starks, Patrick J.

Temperature Sensitivity Characterization of a Silicon Diode Array Spectrometer

Starks, Patrick J.

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Order at Subito €

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Title:

Temperature Sensitivity Characterization of a Silicon Diode Array Spectrometer

Contributors:

Starks, Patrick J. (author) / Walter-Shea, Elizabeth A. / Schiebe, Frank R. / Markham, Brian L.

Published in:

Remote sensing of environment ; 51

Publication date:

1995

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Keywords:

Erde , Umweltveränderung , Fernerkundung , Umweltforschung , Umweltüberwachung , Umweltschaden

Classification:

BKL: 43.03 Methoden der Umweltforschung und des Umweltschutzes / 38.03 Methoden und Techniken der Geowissenschaften / 74.41 Luftaufnahmen, Photogrammetrie

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