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Characterization of the Accuracy and Precision of Spectral Measurements by a Portable, Silicon Diode Array Spectrometer

Starks, Patrick J.

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Characterization of the Accuracy and Precision of Spectral Measurements by a Portable, Silicon Diode Array Spectrometer

Starks, Patrick J.

Characterization of the Accuracy and Precision of Spectral Measurements by a Portable, Silicon Diode Array Spectrometer

Starks, Patrick J.

Access

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Characterization of the Accuracy and Precision of Spectral Measurements by a Portable, Silicon Diode Array Spectrometer

Contributors:

Starks, Patrick J. (author) / Schiebe, Frank R. / Schalles, John F.

Published in:

Photogrammetric engineering & remote sensing ; 61

Publication date:

1995

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Keywords:

Geodäsie , Zeitschrift , Fernerkundung , Fotogrammetrie , Geoinformation , Satellitengeodäsie

Classification:

BKL: 74.41 / 38.03 Methoden und Techniken der Geowissenschaften / 74.41 Luftaufnahmen, Photogrammetrie / 38.03
Local classification TIB: 770/3220
RVK: RA 4132.

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