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    Application of electrical resistivity tomography in investigating depth of permafrost base and permafrost structure in Tibetan Plateau

    New search for: You, Yanhui
    New search for: Yu, Qihao
    New search for: Pan, Xicai
    New search for: Wang, Xinbin
    New search for: Guo, Lei

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    Application of electrical resistivity tomography in investigating depth of permafrost base and permafrost structure in Tibetan Plateau

    New search for: You, Yanhui
    New search for: Yu, Qihao
    New search for: Pan, Xicai
    New search for: Wang, Xinbin
    New search for: Guo, Lei

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Application of electrical resistivity tomography in investigating depth of permafrost base and permafrost structure in Tibetan Plateau

    New search for: You, Yanhui
    New search for: Yu, Qihao
    New search for: Pan, Xicai
    New search for: Wang, Xinbin
    New search for: Guo, Lei

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Application of electrical resistivity tomography in investigating depth of permafrost base and permafrost structure in Tibetan Plateau

    Contributors:

    You, Yanhui (author) / Yu, Qihao / Pan, Xicai / Wang, Xinbin / Guo, Lei

    Published in:

    Cold regions science and technology ; 87

    Publication date:

    2013

    ISSN:

    0165-232X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    BKL:  50.99 Technik allgemein: Sonstiges / 38.43 Gletscherkunde / 56.20 Ingenieurgeologie, Bodenmechanik

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