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SFFM and SNOM of Heterogeneous Materials
Abstract It is often difficult to characterize and distinguish heterogeneous materials with domain sizes below 1 micrometer. The range between 1 nm and 1 μm lies in the crossover region where light scattering is applicable to the upper wavelength range and where x-ray and neutron scattering is strongest for the lower wavelength end. In addition the scattering methods require careful experimental procedures for a reconstruction of the real space structure. Scanning probe methods do provide a direct access to the surface properties in the range of interest. They are complementary to the recently developed x-ray imaging methods. In this paper we discuss the application of the scanning force and friction microscope and the near-field optical microscope to heterogeneous surfaces. The image formation process in both microscopes is different: the scanning force and friction microscope probes the nanomechanical properties of sample surfaces. The near-field optical microscope on the other hand measures the reflectivity, absorption or the fluorescence near the sample surface. As an application we discuss the imaging of polymer surfaces.
SFFM and SNOM of Heterogeneous Materials
Abstract It is often difficult to characterize and distinguish heterogeneous materials with domain sizes below 1 micrometer. The range between 1 nm and 1 μm lies in the crossover region where light scattering is applicable to the upper wavelength range and where x-ray and neutron scattering is strongest for the lower wavelength end. In addition the scattering methods require careful experimental procedures for a reconstruction of the real space structure. Scanning probe methods do provide a direct access to the surface properties in the range of interest. They are complementary to the recently developed x-ray imaging methods. In this paper we discuss the application of the scanning force and friction microscope and the near-field optical microscope to heterogeneous surfaces. The image formation process in both microscopes is different: the scanning force and friction microscope probes the nanomechanical properties of sample surfaces. The near-field optical microscope on the other hand measures the reflectivity, absorption or the fluorescence near the sample surface. As an application we discuss the imaging of polymer surfaces.
SFFM and SNOM of Heterogeneous Materials
Marti, O. (author) / Weilandt, E. (author) / Rosa, A. (author) / Staud, J. (author) / Zink, B. (author) / Hörsch, I. (author) / Kusche, R. (author) / Kirschenhofer, O. (author) / Hollricher, O. (author)
1997-01-01
17 pages
Article/Chapter (Book)
Electronic Resource
English
Scanning Tunneling Microscope , Scanning Probe Microscope , Scanning Near Field Optical Microscope , Scanning Force Microscope , Local Stiffness Physics , Condensed Matter Physics , Surfaces and Interfaces, Thin Films , Physical Chemistry , Characterization and Evaluation of Materials , Measurement Science and Instrumentation
Combined SNOM/AFM microscopy with micromachined nanoapertures
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Nanoscopic studies investigated by hybrid SNOM/STM
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Comparison of PSTM with A-SNOM [4098-18]
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Mapping of X-ray induced luminescence using a SNOM probe
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Fabrication by wet etching of multilayer GaAlAs/GaAs microtips for SNOM applications [4098-22]
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