Force Microscopy: Fid-Bau Portal

Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

Force Microscopy

Heinzelmann, H. / Meyer, E. / Rudin, H. / Güntherodt, H.-J.

Abstract Force microscopy is a new technique which allows the investigation of minute interactions on a micrometer down to an atomic scale. We will give a short overview of the most important experimental aspects and describe recent trends in instrumentation and force probe design. Different forces which have been studied by force microscopy are summarized. The emphasis is put on the imaging mode of force microscopy in the regime of repulsive contact forces, commonly called atomic force microscopy (AFM). Numerous examples from our group as well as from other laboratories illustrate the high resolution capability of AFM, and the wide variety of samples studied so far show the applicability of AFM to different fields of actual interest, such as surface science, biology and technology.

Access

Check availability in my library

Order at Subito €

Page navigation

Document information

Export, share and cite

Force Microscopy

Heinzelmann, H. / Meyer, E. / Rudin, H. / Güntherodt, H.-J.

Abstract Force microscopy is a new technique which allows the investigation of minute interactions on a micrometer down to an atomic scale. We will give a short overview of the most important experimental aspects and describe recent trends in instrumentation and force probe design. Different forces which have been studied by force microscopy are summarized. The emphasis is put on the imaging mode of force microscopy in the regime of repulsive contact forces, commonly called atomic force microscopy (AFM). Numerous examples from our group as well as from other laboratories illustrate the high resolution capability of AFM, and the wide variety of samples studied so far show the applicability of AFM to different fields of actual interest, such as surface science, biology and technology.

Force Microscopy

Heinzelmann, H. / Meyer, E. / Rudin, H. / Güntherodt, H.-J.

Abstract Force microscopy is a new technique which allows the investigation of minute interactions on a micrometer down to an atomic scale. We will give a short overview of the most important experimental aspects and describe recent trends in instrumentation and force probe design. Different forces which have been studied by force microscopy are summarized. The emphasis is put on the imaging mode of force microscopy in the regime of repulsive contact forces, commonly called atomic force microscopy (AFM). Numerous examples from our group as well as from other laboratories illustrate the high resolution capability of AFM, and the wide variety of samples studied so far show the applicability of AFM to different fields of actual interest, such as surface science, biology and technology.

Access

Check availability in my library

Order at Subito €

Page navigation

Document information

Export, share and cite

Document information

Title:

Force Microscopy

Contributors:

Heinzelmann, H. (author) / Meyer, E. (author) / Rudin, H. (author) / Güntherodt, H.-J. (author)

Published in:

Scanning Tunneling Microscopy and Related Methods ; 443-467

NATO ASI Series ; 184

Publication date:

1990-01-01

Size:

25 pages

ISBN:

978-90-481-4075-6 , 978-94-015-7871-4

ISSN:

DOI:

https://doi.org/10.1007/978-94-015-7871-4_25

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Atomic Force Microscope , Scanning Tunneling Microscope , Liquid Bridge , Charge Density Wave , Atomic Resolution Physics , Physics, general , Surfaces and Interfaces, Thin Films , Physical Chemistry , Biophysics and Biological Physics

Similar titles

Force Microscopy

Professor Dr. Meyer, Ernst / Professor Dr. Hug, Hans Josef / Dr. Bennewitz, Roland | Springer Verlag | 2004

Magnetic Force Microscopy

Hartmann, U. | British Library Online Contents | 1999

Ultrasonic Force Microscopy

Yamanaka, K. | British Library Online Contents | 1996

Atomic Force Microscopy

West, P. / Starostina, N. | British Library Online Contents | 2004

Chemical Force Microscopy

Noy, A. / Vezenov, D. V. / Lieber, C. M. | British Library Online Contents | 1997