A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Force Microscopy
Abstract The basic concept of force microscopy is the measurement of forces between a sharp tip and a sample surface. Most commonly, the tip is mounted on the end of a cantilever which serves as a force sensor. Either the static deflection of the cantilever or the change in its dynamic properties due to tip—sample forces can be exploited. The limit of force detection is far lower than the force between atoms at lattice distances, explaining the widely used term atomic force microscope. In analogy to scanning tunneling microscopy, we will refer to the method as scanning force microscopy (SFM).
Force Microscopy
Abstract The basic concept of force microscopy is the measurement of forces between a sharp tip and a sample surface. Most commonly, the tip is mounted on the end of a cantilever which serves as a force sensor. Either the static deflection of the cantilever or the change in its dynamic properties due to tip—sample forces can be exploited. The limit of force detection is far lower than the force between atoms at lattice distances, explaining the widely used term atomic force microscope. In analogy to scanning tunneling microscopy, we will refer to the method as scanning force microscopy (SFM).
Force Microscopy
Professor Dr. Meyer, Ernst (author) / Professor Dr. Hug, Hans Josef (author) / Dr. Bennewitz, Roland (author)
2004-01-01
51 pages
Article/Chapter (Book)
Electronic Resource
English
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