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Indexing Diffraction Patterns

Williams, David B. / Carter, C. Barry

Abstract Since the strength of TEM is that you can obtain both crystallographic data and an image from the same part of your specimen, a method for interpreting the DP is essential. The first step in any interpretation is to index your pattern. You can proceed in several ways, depending on how much information you already know about your specimen. We will begin the chapter by considering the experimental approach with the aim of being able to identify shortcuts whenever possible. The experienced microscopist will readily identify many patterns just by looking at them, but will still need to index new patterns or to identify unfamiliar ones. The fastest and most efficient experimental approach may take advantage of several concepts covered in the preceding two chapters and the following three.

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Indexing Diffraction Patterns

Williams, David B. / Carter, C. Barry

Abstract Since the strength of TEM is that you can obtain both crystallographic data and an image from the same part of your specimen, a method for interpreting the DP is essential. The first step in any interpretation is to index your pattern. You can proceed in several ways, depending on how much information you already know about your specimen. We will begin the chapter by considering the experimental approach with the aim of being able to identify shortcuts whenever possible. The experienced microscopist will readily identify many patterns just by looking at them, but will still need to index new patterns or to identify unfamiliar ones. The fastest and most efficient experimental approach may take advantage of several concepts covered in the preceding two chapters and the following three.

Indexing Diffraction Patterns

Williams, David B. / Carter, C. Barry

Abstract Since the strength of TEM is that you can obtain both crystallographic data and an image from the same part of your specimen, a method for interpreting the DP is essential. The first step in any interpretation is to index your pattern. You can proceed in several ways, depending on how much information you already know about your specimen. We will begin the chapter by considering the experimental approach with the aim of being able to identify shortcuts whenever possible. The experienced microscopist will readily identify many patterns just by looking at them, but will still need to index new patterns or to identify unfamiliar ones. The fastest and most efficient experimental approach may take advantage of several concepts covered in the preceding two chapters and the following three.

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Title:

Indexing Diffraction Patterns

Contributors:

Williams, David B. (author) / Carter, C. Barry (author)

Published in:

Transmission Electron Microscopy ; 265-287

Publication date:

1996-01-01

Size:

23 pages

ISBN:

978-0-306-45324-3 , 978-1-4757-2519-3

DOI:

https://doi.org/10.1007/978-1-4757-2519-3_18

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Orientation Relationship , Zone Axis , Radial Distribution Function , Great Circle , Stereographic Projection Physics , Spectroscopy and Microscopy , Surface and Interface Science, Thin Films , Solid State Physics , Characterization and Evaluation of Materials , Biological Microscopy

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