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Realistic Atomistic Modeling of Mound Formation During Multilayer Growth: Metal(100) Homoepitaxy
Abstract A realistic atomistic lattice-gas model is developed which describes the key features of film morphologies observed for multilayer homoepitaxial growth on Ag(100) in the temperature range 175-300 K corresponding to “mound formation”. The model accounts for irreversible formation of islands in each layer mediated by terrace diffusion, growth coalescence of islands within each layer, a non-uniform step edge barrier inhibiting downward transport, and restricted rounding of kinks by adatoms at island edges (at lower temperatures).
Realistic Atomistic Modeling of Mound Formation During Multilayer Growth: Metal(100) Homoepitaxy
Abstract A realistic atomistic lattice-gas model is developed which describes the key features of film morphologies observed for multilayer homoepitaxial growth on Ag(100) in the temperature range 175-300 K corresponding to “mound formation”. The model accounts for irreversible formation of islands in each layer mediated by terrace diffusion, growth coalescence of islands within each layer, a non-uniform step edge barrier inhibiting downward transport, and restricted rounding of kinks by adatoms at island edges (at lower temperatures).
Realistic Atomistic Modeling of Mound Formation During Multilayer Growth: Metal(100) Homoepitaxy
Caspersen, K. J. ( author ) / Evans, J. W. ( author )
2002-01-01
10 pages
Article/Chapter (Book)
Electronic Resource
English
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