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Recent Advances in LEEM/PEEM for Structural and Chemical Analysis

Bauer, E. / Franz, T. / Koziol, C. / Lilienkamp, G. / Schmidt, T.

Abstract Non-scanning surface electron microscopy with slow emitted and reflected electrons is slowly approaching the goals set more than five years ago. This paper discusses mainly the present state of art of imaging with a multimethod instrument which allows LEED, LEEM, MEM and various emission microscopies without and with energy filtering, using electrons or photons as primary species. It includes also a brief comparison with spin-polarized LEEM and with pure emission microscopy.

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Recent Advances in LEEM/PEEM for Structural and Chemical Analysis

Bauer, E. / Franz, T. / Koziol, C. / Lilienkamp, G. / Schmidt, T.

Abstract Non-scanning surface electron microscopy with slow emitted and reflected electrons is slowly approaching the goals set more than five years ago. This paper discusses mainly the present state of art of imaging with a multimethod instrument which allows LEED, LEEM, MEM and various emission microscopies without and with energy filtering, using electrons or photons as primary species. It includes also a brief comparison with spin-polarized LEEM and with pure emission microscopy.

Recent Advances in LEEM/PEEM for Structural and Chemical Analysis

Bauer, E. / Franz, T. / Koziol, C. / Lilienkamp, G. / Schmidt, T.

Abstract Non-scanning surface electron microscopy with slow emitted and reflected electrons is slowly approaching the goals set more than five years ago. This paper discusses mainly the present state of art of imaging with a multimethod instrument which allows LEED, LEEM, MEM and various emission microscopies without and with energy filtering, using electrons or photons as primary species. It includes also a brief comparison with spin-polarized LEEM and with pure emission microscopy.

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Title:

Recent Advances in LEEM/PEEM for Structural and Chemical Analysis

Contributors:

Bauer, E. (author) / Franz, T. (author) / Koziol, C. (author) / Lilienkamp, G. (author) / Schmidt, T. (author)

Published in:

Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale ; 75-91

NATO ASI Series ; 333

Publication date:

1997-01-01

Size:

17 pages

ISBN:

978-94-010-6414-9 , 978-94-011-5724-7

ISSN:

DOI:

https://doi.org/10.1007/978-94-011-5724-7_5

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Chromatic Aberration , Image Acquisition Time , Electron Stimulate Desorption , Energy Filter , Electron Emission Microscopy Physics , Condensed Matter Physics , Surfaces and Interfaces, Thin Films , Physical Chemistry , Characterization and Evaluation of Materials , Measurement Science and Instrumentation

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