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Field Electron Emission from Atomic-Size Microtips

Saenz, J. J. / Garcia, N. / Vu, Thien Binh / Raedt, H.

Abstract The influence of quantum size effects and atomic geometry on the field emission characteristics (energy distribution, intensity-voltage, angular spread of the emitted beam, resolution) of atomic-size microtips is analyzed. Theoretical models are propose to analyze the influence of atomic-size protrusions on the properties of the emitted beam. It is shown that a tip with a small protrusion can be used as a source of very collimated electron beams. The conditions under which is it possible to obtain atomic resolution are discussed. Simple formulas relating the angular spread and the resolution with the experimental parameters are presented. Field emission experiments on “build up” and “teton” tips are presented together with the basic principles of the fabrication technique.

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Field Electron Emission from Atomic-Size Microtips

Saenz, J. J. / Garcia, N. / Vu, Thien Binh / Raedt, H.

Abstract The influence of quantum size effects and atomic geometry on the field emission characteristics (energy distribution, intensity-voltage, angular spread of the emitted beam, resolution) of atomic-size microtips is analyzed. Theoretical models are propose to analyze the influence of atomic-size protrusions on the properties of the emitted beam. It is shown that a tip with a small protrusion can be used as a source of very collimated electron beams. The conditions under which is it possible to obtain atomic resolution are discussed. Simple formulas relating the angular spread and the resolution with the experimental parameters are presented. Field emission experiments on “build up” and “teton” tips are presented together with the basic principles of the fabrication technique.

Field Electron Emission from Atomic-Size Microtips

Saenz, J. J. / Garcia, N. / Vu, Thien Binh / Raedt, H.

Abstract The influence of quantum size effects and atomic geometry on the field emission characteristics (energy distribution, intensity-voltage, angular spread of the emitted beam, resolution) of atomic-size microtips is analyzed. Theoretical models are propose to analyze the influence of atomic-size protrusions on the properties of the emitted beam. It is shown that a tip with a small protrusion can be used as a source of very collimated electron beams. The conditions under which is it possible to obtain atomic resolution are discussed. Simple formulas relating the angular spread and the resolution with the experimental parameters are presented. Field emission experiments on “build up” and “teton” tips are presented together with the basic principles of the fabrication technique.

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Title:

Field Electron Emission from Atomic-Size Microtips

Contributors:

Saenz, J. J. (author) / Garcia, N. (author) / Vu, Thien Binh (author) / Raedt, H. (author)

Published in:

Scanning Tunneling Microscopy and Related Methods ; 409-441

NATO ASI Series ; 184

Publication date:

1990-01-01

Size:

33 pages

ISBN:

978-90-481-4075-6 , 978-94-015-7871-4

ISSN:

DOI:

https://doi.org/10.1007/978-94-015-7871-4_24

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Tunnel Barrier , Angular Spread , Equipotential Surface , Equipotential Line , Small Protrusion Physics , Physics, general , Surfaces and Interfaces, Thin Films , Physical Chemistry , Biophysics and Biological Physics

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