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RHEED Intensity Analysis on a Single Domain Si(100)-2 × 1
Abstract The clean Si(100) shows a (2×1) reconstructed structure, which has been studied in recent years by LEED[1], scanning tunneling microscopy (STM)[2], RHEED[3] and so on. On the reconstructed structure, there are several proposed models. Among these models, the dimer models appear to explain most of the experimental results. For instance, Tromp et al. [2] have shown arrays of dimers with some vacancies in their STM image, which favors the dimer model. There are several versions of dimer model. One is a symmetric dimer model proposed by Applebaum and Hamann [4]. An asymmetric dimer model by Chadi [5] was derived from energy minimization calculation. Another is a twisted dimer model which was proposed to explain LEED intensity curves as a function of the incident beam energy by Jona et al.[1]. There are other modified models as well.
RHEED Intensity Analysis on a Single Domain Si(100)-2 × 1
Abstract The clean Si(100) shows a (2×1) reconstructed structure, which has been studied in recent years by LEED[1], scanning tunneling microscopy (STM)[2], RHEED[3] and so on. On the reconstructed structure, there are several proposed models. Among these models, the dimer models appear to explain most of the experimental results. For instance, Tromp et al. [2] have shown arrays of dimers with some vacancies in their STM image, which favors the dimer model. There are several versions of dimer model. One is a symmetric dimer model proposed by Applebaum and Hamann [4]. An asymmetric dimer model by Chadi [5] was derived from energy minimization calculation. Another is a twisted dimer model which was proposed to explain LEED intensity curves as a function of the incident beam energy by Jona et al.[1]. There are other modified models as well.
RHEED Intensity Analysis on a Single Domain Si(100)-2 × 1
Kawamura, T. (author) / Takahashi, N. (author) / Sakamoto, T. (author) / Sakamoto, K. (author) / Hashiguchi, G. (author)
1988-01-01
5 pages
Article/Chapter (Book)
Electronic Resource
English
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