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Obtaining CBED Patterns

Williams, David B. / Carter, C. Barry

Abstract We know that SAD, while giving us useful information about the specimen, has two severe limitations: We have to be very cautious in interpreting SAD patterns from areas which are less than ~0.5 lam in diameter. This size is large compared to the dimensions of many crystalline features that interest us in materials science (Chapter 16). SAD patterns contain only rather imprecise two-dimensional crystallographic information because the Bragg conditions are relaxed for a thin specimen and small grains within the specimen (Chapter 17).

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Obtaining CBED Patterns

Williams, David B. / Carter, C. Barry

Abstract We know that SAD, while giving us useful information about the specimen, has two severe limitations: We have to be very cautious in interpreting SAD patterns from areas which are less than ~0.5 lam in diameter. This size is large compared to the dimensions of many crystalline features that interest us in materials science (Chapter 16). SAD patterns contain only rather imprecise two-dimensional crystallographic information because the Bragg conditions are relaxed for a thin specimen and small grains within the specimen (Chapter 17).

Obtaining CBED Patterns

Williams, David B. / Carter, C. Barry

Abstract We know that SAD, while giving us useful information about the specimen, has two severe limitations: We have to be very cautious in interpreting SAD patterns from areas which are less than ~0.5 lam in diameter. This size is large compared to the dimensions of many crystalline features that interest us in materials science (Chapter 16). SAD patterns contain only rather imprecise two-dimensional crystallographic information because the Bragg conditions are relaxed for a thin specimen and small grains within the specimen (Chapter 17).

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Title:

Obtaining CBED Patterns

Contributors:

Williams, David B. (author) / Carter, C. Barry (author)

Published in:

Transmission Electron Microscopy ; 301-318

Publication date:

1996-01-01

Size:

18 pages

ISBN:

978-0-306-45324-3 , 978-1-4757-2519-3

DOI:

https://doi.org/10.1007/978-1-4757-2519-3_20

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Zone Axis , Reciprocal Lattice , Diffraction Maximum , Thin Specimen , Kikuchi Line Physics , Spectroscopy and Microscopy , Surface and Interface Science, Thin Films , Solid State Physics , Characterization and Evaluation of Materials , Biological Microscopy

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