Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Determinability of Complete Residual Strain Tensor from Multiple CBED Patterns

    New search for: Morawiec, A.
    New search for: Reimers, W.
    New search for: Quander, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Determinability of Complete Residual Strain Tensor from Multiple CBED Patterns

    New search for: Morawiec, A.
    New search for: Reimers, W.
    New search for: Quander, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Determinability of Complete Residual Strain Tensor from Multiple CBED Patterns

    New search for: Morawiec, A.
    New search for: Reimers, W.
    New search for: Quander, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Determinability of Complete Residual Strain Tensor from Multiple CBED Patterns

    Contributors:

    Morawiec, A. (author) / Reimers, W. / Quander, S.

    Published in:

    Residual Stresses VII: ECRS 7 - Proceedings of the 7^t^h European Conference on Residual Stresses Berlin, Germany, 13-15 September 2006 ; 115-120

    MATERIALS SCIENCE FORUM ; 524/525

    Publication date:

    2006-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Obtaining CBED Patterns

    Williams, David B. / Carter, C. Barry | Springer Verlag | 1996

    Analysis of local lattice strain around oxygen precipitates in silicon crystals using CBED technique

    Yonemura, M. / Sueoka, K. / Kamei, K. | British Library Online Contents | 1998

    Prospects of the multislice method for CBED pattern calculation

    Kaiser, U. / Chuvilin, A. | British Library Online Contents | 2006

    Strain induced by Ti salicidation in sub-quarter-micron CMOS devices, as measured by TEM/CBED

    Benedetti, A. / Cullis, A. G. / Armigliato, A. et al. | British Library Online Contents | 2002

    Determination of the lattice parameters using Convergent Beam Electron Diffraction (CBED) method

    Gigla, M. / Paczkowski, P. / Kostka, A. et al. | British Library Online Contents | 2003

    Back to top