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    Small‐ and Wide‐Angle X‐Ray Scattering for Characterization of Nanostructured Particles

    New search for: Guo, X.
    New search for: Gutsche, A.
    New search for: Nirschl, H.

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    Small‐ and Wide‐Angle X‐Ray Scattering for Characterization of Nanostructured Particles

    New search for: Guo, X.
    New search for: Gutsche, A.
    New search for: Nirschl, H.

    Access

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    Check availability in my library
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    Small‐ and Wide‐Angle X‐Ray Scattering for Characterization of Nanostructured Particles

    New search for: Guo, X.
    New search for: Gutsche, A.
    New search for: Nirschl, H.

    Access

    Check access
    Check availability in my library
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    Document information
    Title:

    Small‐ and Wide‐Angle X‐Ray Scattering for Characterization of Nanostructured Particles

    Contributors:

    Guo, X. (author) / Gutsche, A. (author) / Nirschl, H. (author)

    Published in:

    Chemie Ingenieur Technik ; 86 ; 1543-1544

    Publication date:

    2014-09-01

    Size:

    2 pages

    ISSN:

    0009-286X , 1522-2640

    DOI:

    https://doi.org/10.1002/cite.201450179

    Type of media:

    Article (Journal)

    Type of material:

    Electronic Resource

    Language:

    English

    Keywords:

    Nanoparticles , Small‐ and wide‐angle X‐ray scattering

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