High‐Throughput, Label‐Free and Slide‐Free Histological Imaging by Computational Microscopy and Unsupervised Learning (Adv. Sci. 2/2022): Fid-Bau Portal

High‐Throughput, Label‐Free and Slide‐Free Histological Imaging by Computational Microscopy and Unsupervised Learning (Adv. Sci. 2/2022)

Zhang, Yan / Kang, Lei / Wong, Ivy H. M. / Dai, Weixing / Li, Xiufeng / Chan, Ronald C. K. / Hsin, Michael K. Y. / Wong, Terence T. W.

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High‐Throughput, Label‐Free and Slide‐Free Histological Imaging by Computational Microscopy and Unsupervised Learning (Adv. Sci. 2/2022)

Zhang, Yan / Kang, Lei / Wong, Ivy H. M. / Dai, Weixing / Li, Xiufeng / Chan, Ronald C. K. / Hsin, Michael K. Y. / Wong, Terence T. W.

High‐Throughput, Label‐Free and Slide‐Free Histological Imaging by Computational Microscopy and Unsupervised Learning (Adv. Sci. 2/2022)

Zhang, Yan / Kang, Lei / Wong, Ivy H. M. / Dai, Weixing / Li, Xiufeng / Chan, Ronald C. K. / Hsin, Michael K. Y. / Wong, Terence T. W.

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Document information

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Title:

High‐Throughput, Label‐Free and Slide‐Free Histological Imaging by Computational Microscopy and Unsupervised Learning (Adv. Sci. 2/2022)

Contributors:

Zhang, Yan (author) / Kang, Lei (author) / Wong, Ivy H. M. (author) / Dai, Weixing (author) / Li, Xiufeng (author) / Chan, Ronald C. K. (author) / Hsin, Michael K. Y. (author) / Wong, Terence T. W. (author)

Published in:

Advanced Science ; 9

Publication date:

2022-01-01

Size:

1 pages

ISSN:

2198-3844

DOI:

https://doi.org/10.1002/advs.202270012

Type of media:

Article (Journal)

Type of material:

Electronic Resource

Language:

English

Zhang, Yan / Kang, Lei / Wong, Ivy H. M. et al. | Wiley | 2022

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