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Infrared characterization studies of polycrystalline silicon annealed in a nitrogen atmosphere
Infrared characterization studies of polycrystalline silicon annealed in a nitrogen atmosphere
Infrared characterization studies of polycrystalline silicon annealed in a nitrogen atmosphere
Gupta, D. (Autor:in) / Awasthy, B. (Autor:in) / Varma, S. P. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 28 ; 1488
01.01.1993
1488 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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