Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Chemical composition by Auger sputter-depth profiles of GaAs oxide layers formed after chemical or Ar^+ ion etchings
Chemical composition by Auger sputter-depth profiles of GaAs oxide layers formed after chemical or Ar^+ ion etchings
Chemical composition by Auger sputter-depth profiles of GaAs oxide layers formed after chemical or Ar^+ ion etchings
Bresse, J. F. (Autor:in)
APPLIED SURFACE SCIENCE ; 65//66 ; 825
01.01.1993
825 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
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