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Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling
Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling
Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling
Baunack, S. (Autor:in) / Mudali, U. K. (Autor:in) / Gebert, A. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 162-166
01.01.2005
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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