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Crystallization of amorphous thin low pressure chemical vapour deposition silicon films: in situ TEM measurement of grain growth rates
Crystallization of amorphous thin low pressure chemical vapour deposition silicon films: in situ TEM measurement of grain growth rates
Crystallization of amorphous thin low pressure chemical vapour deposition silicon films: in situ TEM measurement of grain growth rates
Guillemet, J. P. (Autor:in) / De Mauduit, B. (Autor:in) / Pieraggi, B. (Autor:in) / Campo, E. (Autor:in)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 12 ; 910
01.01.1993
910 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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