Proposed Methods for Depth Profiling of Residual Stresses Using Grazing Incidence X-Ray Diffraction (GIXD)

Predecki, P. / Zhu, X. / Ballard, B. | British Library Online Contents | 1993

Generalised residual stress depth profiling at the nanoscale using focused ion beam milling

Salvati, E. / Romano-Brandt, L. / Mughal, M.Z. et al. | British Library Online Contents | 2019

Depth distribution of residual stresses in laser-surface-melted steel

Kralova, R. | British Library Online Contents | 1993

Residual stresses in Inconel 718 electron beam welds

Biswas, S. / Reddy, G. M. / Mohandas, T. et al. | British Library Online Contents | 2004

Depth profiling of organic materials using improved ion beam conditions

Cramer, H. G. / Grehl, T. / Kollmer, F. et al. | British Library Online Contents | 2008