A platform for research: civil engineering, architecture and urbanism
Proposed Methods for Depth Profiling of Residual Stresses Using Beam-Limiting Masks
Proposed Methods for Depth Profiling of Residual Stresses Using Beam-Limiting Masks
Proposed Methods for Depth Profiling of Residual Stresses Using Beam-Limiting Masks
Predecki, P. (author) / Ballard, B. (author) / Zhu, X. (author)
1993-01-01
247 pages
Article (Journal)
Unknown
DDC:
539.7222
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 1993
|Generalised residual stress depth profiling at the nanoscale using focused ion beam milling
British Library Online Contents | 2019
|Depth distribution of residual stresses in laser-surface-melted steel
British Library Online Contents | 1993
|Residual stresses in Inconel 718 electron beam welds
British Library Online Contents | 2004
|Depth profiling of organic materials using improved ion beam conditions
British Library Online Contents | 2008
|