Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Ballistic electron emission microscopy of metal/semiconductor interfaces and heterojunctions
Ballistic electron emission microscopy of metal/semiconductor interfaces and heterojunctions
Ballistic electron emission microscopy of metal/semiconductor interfaces and heterojunctions
Williams, R. H. (Autor:in)
APPLIED SURFACE SCIENCE ; 70/71 ; 386
01.01.1993
386 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Ballistic electron emission microscopy of metal/semiconductor interfaces and heterojunctions
British Library Online Contents | 1993
|Ballistic electron emission microscopy of InAs/Ga~1~-~xAl~xAs relaxed heterostructure interfaces
British Library Online Contents | 1995
|Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces and Carrier Transport
British Library Online Contents | 1996
|Ballistic electron emission microscopy studies of Au/CaF~2/n-Si(111) interfaces
British Library Online Contents | 1998
|Lateral currents in ballistic electron emission microscopy
British Library Online Contents | 1999
|