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Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces and Carrier Transport
Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces and Carrier Transport
Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces and Carrier Transport
Douglas Bell, L. (Autor:in) / Kaiser, W. J. (Autor:in)
ANNUAL REVIEW OF MATERIALS SCIENCE ; 26 ; 189-222
01.01.1996
34 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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