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Strain Relaxation During Epitaxial Crystallization of Ge~xSi~1~-~x Alloy Layers Produced by Ion-Implantation
Strain Relaxation During Epitaxial Crystallization of Ge~xSi~1~-~x Alloy Layers Produced by Ion-Implantation
Strain Relaxation During Epitaxial Crystallization of Ge~xSi~1~-~x Alloy Layers Produced by Ion-Implantation
Elliman, R. G. (Autor:in) / Wong, W. C. (Autor:in)
MATERIALS SCIENCE FORUM ; 507
01.01.1994
507 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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