Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
In Situ SEM Observations of Electromigration Voids in Al Lines under Passivation
In Situ SEM Observations of Electromigration Voids in Al Lines under Passivation
In Situ SEM Observations of Electromigration Voids in Al Lines under Passivation
Flinn, P. A. (Autor:in) / Madden, M. C. (Autor:in) / Marieb, T. N. (Autor:in)
MRS BULLETIN- MATERIALS RESEARCH SOCIETY ; 19 ; 51
01.01.1994
51 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
A simulation of asymmetrical voids evolution induced by electromigration
| British Library Online Contents | 2000
Electromigration Failure of Metal Lines
| British Library Online Contents | 2006
Electromigration-induced strain relaxation in Cu conductor lines
| British Library Online Contents | 2011
| British Library Online Contents | 2008
| British Library Online Contents | 2014