Analysis of Strain Transfer through the Mg/Ti Interface Using Crystallographic Orientation Analysis Based on Electron Back-Scattered Diffraction Patterns

Kawamoto, H. / Miura, S. / Yano, K. et al. | British Library Online Contents | 2008

Study of Crystallographic Orientation of in situ -Si~3N~4 Composite by Electron Back Scattered Diffraction (EBSD) Method

Yasutomi, Y. / Sakaida, Y. / Hirosaki, N. et al. | British Library Online Contents | 1999

Study of texture in a TiTaNb alloy using electron back scattered diffraction technique

Karthikeyan, T. / Dasgupta, A. / Khan, A. J. et al. | British Library Online Contents | 2005

The use of electron back-scattered diffraction to study the regrowth of amorphised silicon-based heterostructures

Vernon-Parry, K. D. / Abd-El-Rahman, K. F. / Brough, I. et al. | British Library Online Contents | 2001

Grain Size Measurements in Mg-Al High Pressure Die Castings using Electron Back-Scattered Diffraction (EBSD)

Bowles, A. / Nogita, K. / Dargusch, M. et al. | British Library Online Contents | 2004