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Evaluation of matrix effects in SIMS quantification of Al~xGa~1~-~xAs/GaAs heterostructures: a SNMS approach
Evaluation of matrix effects in SIMS quantification of Al~xGa~1~-~xAs/GaAs heterostructures: a SNMS approach
Evaluation of matrix effects in SIMS quantification of Al~xGa~1~-~xAs/GaAs heterostructures: a SNMS approach
Torrisi, A. (Autor:in) / Scandurra, A. (Autor:in) / Licciardello, A. (Autor:in)
APPLIED SURFACE SCIENCE ; 81 ; 259
01.01.1994
259 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
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