XPS and SIMS/SNMS measurements on thin metal oxide layers

Albers, T. / Neumann, M. / Lipinsky, D. et al. | British Library Online Contents | 1993

Comparative SIMS and SNMS analyses of amorphous semiconductor thin films

Gnaser, H. / Bock, W. / Oechsner, H. et al. | British Library Online Contents | 1993

XPS and SIMS/SNMS measurements on thin metal oxide layers

Albers, T. / Neumann, M. / Lipinsky, D. et al. | British Library Online Contents | 1993

Comparative SIMS and SNMS analyses of amorphous semiconductor thin films

Gnaser, H. / Bock, W. / Oechsner, H. et al. | British Library Online Contents | 1993

Characterization of individual atmospheric aerosol particles with SIMS and laser-SNMS

Peterson, R. E. / Nair, A. / Dambach, S. et al. | British Library Online Contents | 2006