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Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)
Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)
Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)
Ballard, B. L. (author) / Predecki, P. K. (author) / Braski, D. N. (author)
1994-01-01
189 pages
Article (Journal)
Unknown
DDC:
539.7222
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