Heavily boron-doped Czochralski (CZ) silicon crystal growth: segregation and constitutional supercooling

Taishi, T. / Huang, X. / Kubota, M. et al. | British Library Online Contents | 2000

Delineation of Flow Pattern Defects in Heavily Boron-doped Czochralski Silicon Wafer

Fang, M. / Yang, D.-r. / Ma, X.-y. et al. | British Library Online Contents | 2006

Thermal analysis of liquid-encapsulated Czochralski-grown InP crystals

Fogliani, S. / Masi, M. / Carra, S. et al. | British Library Online Contents | 1994

Growth and characterization of III-V materials grown by vapor-pressure-controlled Czochralski method: comparison with standard liquid-encapsulated Czochralski materials

Tatsuno, M. / Hosokawa, Y. / Iwasaki, T. et al. | British Library Online Contents | 1994

Investigations of structural defects by etching of GaSb grown by the liquid-encapsulated Czochralski technique

Costa, E. M. / Dedavid, B. A. / Mueller, A. | British Library Online Contents | 1997