Delineation of Flow Pattern Defects in Heavily Boron-doped Czochralski Silicon Wafer

Fang, M. / Yang, D.-r. / Ma, X.-y. et al. | British Library Online Contents | 2006

Structural characterization of heavily Zn-doped liquid encapsulated Czochralski InP

Frigen, C. / Ferrari, C. / Fomari, R. et al. | British Library Online Contents | 1994

Oxygen transportation during Czochralski silicon crystal growth

Hoshikawa, K. / Huang, X. | British Library Online Contents | 2000

Microstructure of flow pattern defects in boron-doped Czochralski-grown silicon

Liu, C. / Hao, Q. / Zhang, J. | British Library Online Contents | 2006

Dislocation behavior in heavily germanium-doped silicon crystal

Taishi, T. / Huang, X. / Yonenaga, I. et al. | British Library Online Contents | 2002