Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by X-ray reflectometry and diffractometry: Fid-Bau Portal

Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by X-ray reflectometry and diffractometry

Pirling, T. / Fricke, K. / Schuessler, M. / Lee, W. Y.

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Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by X-ray reflectometry and diffractometry

Pirling, T. / Fricke, K. / Schuessler, M. / Lee, W. Y.

Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by X-ray reflectometry and diffractometry

Pirling, T. / Fricke, K. / Schuessler, M. / Lee, W. Y.

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Titel:

Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by X-ray reflectometry and diffractometry

Beteiligte:

Pirling, T. (Autor:in) / Fricke, K. (Autor:in) / Schuessler, M. (Autor:in) / Lee, W. Y. (Autor:in) / Fricke, K. / Krozer, V.

Erschienen in:

High Temperature Electronics: Materials Devices Applications ; 70

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 29

Erscheinungsdatum:

01.01.1995

Format / Umfang:

70 pages

ISSN:

0921-5107

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Unbekannt

Klassifikation:

DDC: 620.11

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