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    Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by X-ray reflectometry and diffractometry

    New search for: Pirling, T.
    New search for: Fricke, K.
    New search for: Schuessler, M.
    New search for: Lee, W. Y.
    New search for: Fricke, K.
    New search for: Krozer, V.

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    Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by X-ray reflectometry and diffractometry

    New search for: Pirling, T.
    New search for: Fricke, K.
    New search for: Schuessler, M.
    New search for: Lee, W. Y.
    New search for: Fricke, K.
    New search for: Krozer, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by X-ray reflectometry and diffractometry

    New search for: Pirling, T.
    New search for: Fricke, K.
    New search for: Schuessler, M.
    New search for: Lee, W. Y.
    New search for: Fricke, K.
    New search for: Krozer, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by X-ray reflectometry and diffractometry

    Contributors:

    Pirling, T. (author) / Fricke, K. (author) / Schuessler, M. (author) / Lee, W. Y. (author) / Fricke, K. / Krozer, V.

    Published in:

    High Temperature Electronics: Materials Devices Applications ; 70

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 29

    Publication date:

    1995-01-01

    Size:

    70 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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